Resonant impurity scattering and electron-phonon scattering in the electrical resistivity of Cr thin films

Physical Review B - Condensed Matter and Materials Physics

Volumn 80, Issue 13, 2009, Pages

  Boekelheide, Z ^a   Cooke, David W ^a   Helgren, E ^a   Hellman, F ^a  

^a UNIVERSITY OF CALIFORNIA   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 70749151868     PISSN: 10980121     EISSN: 1550235X     Source Type: Journal    
DOI: 10.1103/PhysRevB.80.134426     Document Type: Article

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