Application of X-ray photoelectron spectroscopy to characterization of Au nanoparticles formed by ion implantation into SiO 2

Applied Surface Science

Volumn 256, Issue 4, 2009, Pages 1061-1064

  Takahiro, K ^a   Oizumi, S ^a   Morimoto, K ^a   Kawatsura, K ^a   Isshiki, T ^a   Nishio, K ^a   Nagata, S ^b   Yamamoto, S ^c   Narumi, K ^c   Naramoto, H ^c  

^a KYOTO INSTITUTE OF TECHNOLOGY   (Japan)

^b TOHOKU UNIVERSITY   (Japan)

^c JAPAN ATOMIC ENERGY AGENCY   (Japan)

Author keywords

Au; Ion implantation; Nanoparticle; SiO 2; Valence band; X ray photoelectron spectroscopy

Indexed keywords

GOLD; GOLD NANOPARTICLES; HIGH RESOLUTION TRANSMISSION ELECTRON MICROSCOPY; ION IMPLANTATION; IONS; NANOPARTICLES; PARTICLE SIZE; PHOTOELECTRONS; PHOTONS; SILICA; TRANSMISSION ELECTRON MICROSCOPY; VALENCE BANDS;

AU PARTICLE SIZES; PROJECTED RANGE; SIO2;

X RAY PHOTOELECTRON SPECTROSCOPY;

EID: 70749149225     PISSN: 01694332     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.apsusc.2009.05.104     Document Type: Article

References (22)

1. DiCenzo S.B., Berry S.D., and Hartford Jr. E.H. Phys. Rev. B 38 (1988) 8465
2. Cox D.M., Eberhardt W., Fayet P., Fu Z., Kessler B., Sherwood R.D., Sondericker D., and Kaldor A. Z. Phys. D: Atoms Mol. Clusters 20 (1991) 385
3. Boyen H.-G., Ethirajan A., Kastle G., Weigl F., Ziemann P., Schmid G., Gärnier M.G., Büttner M., and Oelhafen P. Phys. Rev. Lett. 94 (2005) 016804
4. Wertheim G.K., DiCenzo S.B., and Youngquist S.E. Phys. Rev. Lett. 51 (1983) 2310
5. Quinten M., Sander I., Steiner P., Kreibig U., Fauth K., and Schmid G. Z. Phys. D: Atoms Mol. Clusters 20 (1991) 377
6. Ohgi T., and Fujita D. Phys. Rev. B 66 (2002) 115410
7. Howard A., Clark D.N.S., Mitchell C.E.J., Egdell R.G., and Dhanak V.R. Surf. Sci. 518 (2002) 210
8. O'Shea J.N., Phillips M.A., Taylor M.D.R., Moriarty P., Brust M., and Dhanak V.R. Appl. Phys. Lett. 81 (2002) 5039
9. Powell C.J., and Seah M.P. J. Vac. Sci. Technol. A 8 (1990) 735
10. Powell C.J. Appl. Surf. Sci. 89 (1995) 141
11. Citrin P.H., and Hamann D.R. Phys. Rev. B 10 (1974) 4948
12. Baer Y., Hedën P.F., Hedman J., Klasson M., Nordling C., and Siegbahn K. Phys. Scripta 1 (1970) 55
13. Hagström S.B.M. In: Shirley D.A. (Ed). Electron Spectroscopy (1972), North-Holland, Amsterdam p. 515
14. Hagström S.B.M. In: Shirley D.A. (Ed). Electron Spectroscopy (1972), North-Holland, Amsterdam p. 603
15. Webster X., Salaneck W.R., and Aksay I.A. Solid State Commun. 19 (1976) 329
16. Lee S.-T., Apai G., Mason M.G., Benbow R., and Hurych Z. Phys. Rev. B 23 (1981) 505
17. Egelhoff Jr. W.F. J. Vac. Sci. Technol. 20 (1982) 668
18. Mason M.G. Phys. Rev. B 27 (1983) 748
19. Bzowski A., Sham T.K., Watson R.E., and Weinert M. Phys. Rev. B 51 (1995) 9979
20. Zhang P., and Sham T.K. Phys. Rev. Lett. 90 (2003) 245502
21. Compagnini G., Scalisi A.A., and Puglisi O. Surf. Sci. 600 (2006) L1
22. Jablonski A. Surf. Interface Anal. 23 (1995) 29