Principal component analysis-based reflectance analysis/ synthesis of cosmetic foundation

Journal of Imaging Science and Technology

Volumn 53, Issue 6, 2009, Pages

  Tominaga, Shoji ^a   Moriuchi, Yusuke ^a  

^a CHIBA UNIVERSITY   (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

BASIS FUNCTIONS; DICHROMATIC REFLECTION; DIFFUSE REFLECTANCE; LIGHT INCIDENCE; LINEAR COMBINATIONS; MATERIAL COMPOSITIONS; MODEL BASED APPROACH; NEW APPROACHES; OBSERVATION CONDITION; ONE-DIMENSIONAL BASIS FUNCTIONS; REFLECTANCE CURVE; SINGLE PARAMETER; SKIN SURFACES; SPECTRAL COMPONENTS; SPECTRAL REFLECTANCES; SPECTRAL REFLECTION; WEIGHTING COEFFICIENT;

FEATURE EXTRACTION; FOUNDATIONS; REFLECTION; SKIN; SURFACES;

PRINCIPAL COMPONENT ANALYSIS;

EID: 70749121363     PISSN: 10623701     EISSN: None     Source Type: Journal    
DOI: 10.2352/J.ImagingSci.Technol.2009.53.6.060403     Document Type: Article

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