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Volumn 489, Issue 2, 2010, Pages 415-420
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The role of trace element segregation in the eutectic modification of hypoeutectic Al-Si alloys
a,b
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Author keywords
Crystal growth; Metals and alloys; Microstructure; Synchrotron radiation
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Indexed keywords
ALUMINIUM SILICON ALLOY;
CHEMICALLY MODIFIED;
EUTECTIC MODIFICATION;
EUTECTIC SILICON;
EXPERIMENTAL DATA;
FIBROUS MORPHOLOGY;
HYPOEUTECTIC AL-SI ALLOY;
METALS AND ALLOYS;
NEEDLE-LIKE;
SILICON PHASE;
SOLID-LIQUID INTERFACES;
SPRING-8;
STRUCTURAL TRANSFORMATION;
SYNCHROTRON RADIATION FACILITY;
THEORETICAL CALCULATIONS;
TWIN PLANE RE-ENTRANT EDGES;
X RAY FLUORESCENCE;
X-RAY SOURCES;
ADSORPTION;
ALUMINUM;
CERIUM ALLOYS;
CRYSTAL GROWTH;
CRYSTAL IMPURITIES;
CRYSTAL MICROSTRUCTURE;
CRYSTALLIZATION;
ELECTROMAGNETIC WAVES;
EUROPIUM;
EUTECTICS;
GRAIN BOUNDARIES;
MECHANICAL PROPERTIES;
METALLURGY;
PHASE INTERFACES;
SYNCHROTRON RADIATION;
SYNCHROTRONS;
TRACE ELEMENTS;
YTTERBIUM;
SILICON ALLOYS;
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EID: 70649114464
PISSN: 09258388
EISSN: None
Source Type: Journal
DOI: 10.1016/j.jallcom.2009.09.138 Document Type: Article |
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Times cited : (149)
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References (21)
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