Diagnostics for gaussian process emulators

Technometrics

Volumn 51, Issue 4, 2009, Pages 425-438

  Bastos, Leonardo S ^a   O'hagan, Anthony ^a  

^a UNIVERSITY OF SHEFFIELD   (United Kingdom)

Author keywords

Bayesian inference; Computer experiments; Diagnostics; Emulation; Gaussian process

Indexed keywords

BAYESIAN INFERENCE; COMPUTER EXPERIMENT; COMPUTER PROGRAM; COMPUTER TIME; DATA SETS; GAUSSIAN PROCESSES; REAL-WORLD; SCIENCE AND TECHNOLOGY; STATISTICAL REPRESENTATIONS; TEST DATA; VALIDATION DATA;

BAYESIAN NETWORKS; GAUSSIAN DISTRIBUTION; GAUSSIAN NOISE (ELECTRONIC); INFERENCE ENGINES; MATHEMATICAL MODELS;

SIMULATORS;

EID: 70549095831     PISSN: 00401706     EISSN: None     Source Type: Journal    
DOI: 10.1198/TECH.2009.08019     Document Type: Article

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