Surface chemistry of ion irradiated and heat-treated mullite-type Bi 2Ga4O9 single crystals

Journal of the American Ceramic Society

Volumn 92, Issue 12, 2009, Pages 2993-2998

  Palomares, Francisco J ^a   Paz, Elvira ^a   Soria, Federico ^a   Moya, Jose S ^a   Burianek, Manfred ^b   Muehlberg, Manfred ^b   Schneider, Hartmut ^b  

^a INSTITUTO DE CIENCIA DE MATERIALES DE MADRID   (Spain)

^b UNIVERSITY OF COLOGNE   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

AMORPHOUS PHASE; AS-GROWN; CHEMICAL COMPOSITIONS; DYNAMICAL PROCESS; GAS-SOLID INTERFACE; IN-SITU; INTER-DIFFUSION; ION IRRADIATION; IRRADIATED SURFACE; LOW ENERGY IONS; OXIDATION STATE; PARTIAL REDUCTION; PREFERENTIAL SPUTTERING; SENSING SIGNALS; SURFACE LAYERS; SURFACE STOICHIOMETRY; THERMAL TREATMENT; VACUUM CONDITION;

ANNEALING; ATOMIC FORCE MICROSCOPY; ION BOMBARDMENT; IONS; MULLITE; PHASE INTERFACES; SILICATE MINERALS; STOICHIOMETRY; SURFACE CHEMISTRY; SURFACE ROUGHNESS; SURFACE SEGREGATION; VACUUM; X RAY PHOTOELECTRON SPECTROSCOPY;

SINGLE CRYSTALS;

EID: 70450263327     PISSN: 00027820     EISSN: 15512916     Source Type: Journal    
DOI: 10.1111/j.1551-2916.2009.03296.x     Document Type: Article

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