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Volumn 1147, Issue , 2009, Pages 409-414
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Phase dependence of secondary electron emission at the Cs-Sb-Si (111) interface
a a a,b |
Author keywords
Cesium antimonide; Si(111); X ray photoelectron spectroscopy (XPS)
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Indexed keywords
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EID: 70450237995
PISSN: 0094243X
EISSN: 15517616
Source Type: Conference Proceeding
DOI: 10.1063/1.3183466 Document Type: Conference Paper |
Times cited : (2)
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References (11)
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