Total elimination of sampling errors in polarization imagery obtained with integrated microgrid Polarimeters

Optics Letters

Volumn 34, Issue 20, 2009, Pages 3187-3189

  Tyo, J Scott ^a   LaCasse, Charles F ^a   Ratliff, Bradley M ^a  

^a UNIVERSITY OF ARIZONA   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

ERRORS; LINEAR SYSTEMS; POLARIMETERS;

MICROPOLARIZERS; POINT OF INTEREST; POLARIZATION IMAGERY; POLARIZATION IMAGES; POLARIZATION MEASUREMENTS; POLARIZATION SIGNATURES; STOKES PARAMETERS; SYSTEM FRAMEWORK;

POLARIZATION;

EID: 70450197646     PISSN: 01469592     EISSN: 15394794     Source Type: Journal    
DOI: 10.1364/OL.34.003187     Document Type: Article

References (13)

1. J. S. Tyo, D. H. Goldstein, D. B. Chenault, and J. A. Shaw, Appl. Opt. 45, 5453 (2006).
2. A. G. Andreou and Z. K. Kalayjian, IEEE Sens. J. 2, 566 (2002).
3. G. P. Nordin, J. T. Meier, P. C. Deguzman, and M. Jones, Proc. SPIE 3754, 169 (1999).
4. C. K. Harnett and H. G. Craighead, Appl. Opt. 41, 1291 (2002).
5. B. M. Ratliff, C. F. Lacasse, and J. S. Tyo, Opt. Express 17, 9112 (2009).
6. V Gruev, K. Wu, J. V. der Spiegel, and N. Engheta, Proc. SPIE 6240, 624005 (2006).
7. C. S. L. Chun, D. L. Fleming, and E. J. Torok, Proc. SPIE 2234, 275 (1994).
8. K. Oka and T. Kaneko, Opt. Express 11, 1510 (2003).
9. H. Luo, K. Oka, N. Hagen, T. Tkaczyk, and E. L. Dereniak, Appl. Opt. 45, 8400 (2006).
10. M. W. Kudenov, L. Pezzaniti, E. L. Dereniak, and G. R. Gerhart, Opt. Express 16, 13720 (2008).
11. J. S. Tyo, E. N. Pugh, and N. Engheta, J. Opt. Soc. Am. A 15, 367 (1998).
12. D. L. Bowers, J. K. Boger, L. D. Wellems, S. E. Ortega, M. P. Fetrow, J. E. Hubbs, W. T. Black, B. M. Ratliff, and J. S. Tyo, Opt. Eng. 47, 046403 (2008).
13. B. M. Ratliff, J. S. Tyo, C. F. LaCasse, and W. T. Black, Proc. SPIE 7461, 74610K (2009).