메뉴 건너뛰기




Volumn 42, Issue 22, 2009, Pages

Characterization of the transient thermal-lens effect using top-hat beam Z-scan

Author keywords

[No Author keywords available]

Indexed keywords

KERR EFFECTS; NUMERICAL RESULTS; Z-SCAN MEASUREMENT; Z-SCAN TECHNIQUE;

EID: 70450181667     PISSN: 09534075     EISSN: 13616455     Source Type: Journal    
DOI: 10.1088/0953-4075/42/22/225404     Document Type: Article
Times cited : (11)

References (15)


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.