Femtogram detection and quantitation of residues using laser ionization orthogonal time-of-flight mass spectrometry

Analytical Chemistry

Volumn 81, Issue 20, 2009, Pages 8623-8626

  Yu, Quan ^a   Cao, Zhiyu ^a   Li, Lingfeng ^a   Yan, Bin ^a   Hang, Wei ^a   He, Jian ^a   Huang, Benli ^a  

^a XIAMEN UNIVERSITY   (China)

Author keywords

[No Author keywords available]

Indexed keywords

ABSOLUTE DETECTION LIMITS; ELEMENTAL ANALYSIS; ELEMENTAL DISTRIBUTION; LASER IONIZATION; LIMIT OF DETECTION; LIMIT OF QUANTITATIONS; METAL ELEMENTS; MIXED SALTS; ORDER OF MAGNITUDE; ORTHOGONAL TIME-OF-FLIGHT MASS SPECTROMETERS; RELATIVE SENSITIVITY COEFFICIENTS; SEMI-QUANTITATIVE ANALYSIS; SINGLE LASERS; TIME OF FLIGHT MASS SPECTROMETRY; ULTRATRACES;

IONIZATION; LASERS; MASS SPECTROMETRY; PARTICLE DETECTORS;

MASS SPECTROMETERS;

SODIUM CHLORIDE;

ARTICLE; CALCULATION; CORRELATION COEFFICIENT; LASER IONIZATION ORTHOGONAL TIME OF FLIGHT MASS SPECTROMETRY; QUANTITATIVE ANALYSIS; TIME OF FLIGHT MASS SPECTROMETRY;

EID: 70449939786     PISSN: 00032700     EISSN: None     Source Type: Journal    
DOI: 10.1021/ac901615k     Document Type: Article

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