Evaluate the orderings of risk for failure problems using a more general RPN methodology

Microelectronics Reliability

Volumn 49, Issue 12, 2009, Pages 1586-1596

  Chang, Kuei Hu ^a  

^a DEPARTMENT OF PHYSICS   (Taiwan)

Author keywords

[No Author keywords available]

Indexed keywords

DEMATEL; EFFICIENT ALGORITHM; FAILURE MODE AND EFFECTS ANALYSIS; FAILURE PROBLEMS; OPERATING CONDITION; PRIORITIZATION; PRODUCTION PLANNING; RISK ASSESSMENT METHODS; RISK ITEMS; RISK OF FAILURE; RISK PRIORITY NUMBER; TFT-LCDS; THIN FILM TRANSISTOR LIQUID CRYSTAL DISPLAYS;

ALGORITHMS; FAILURE ANALYSIS; LIQUID CRYSTAL DISPLAYS; LIQUID CRYSTALS; MATHEMATICAL OPERATORS; PRODUCT DESIGN; PRODUCTION CONTROL; QUALITY ASSURANCE; RISK ANALYSIS; RISK MANAGEMENT; SAFETY FACTOR; SPURIOUS SIGNAL NOISE; THIN FILM TRANSISTORS;

RISK ASSESSMENT;

EID: 70449724654     PISSN: 00262714     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.microrel.2009.07.057     Document Type: Article

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