Exchange bias and training effect in Ni/Ag-doped NiO bilayers

Journal of Magnetism and Magnetic Materials

Volumn 322, Issue 5, 2010, Pages 542-547

  Yang, P Y ^a   Zeng, F ^a   Pan, F ^a  

^a TSINGHUA UNIVERSITY   (China)

Author keywords

Exchange bias; NiO thin films; Training effect

Indexed keywords

AG DOPING; AG NANOPARTICLE; BI-LAYER; COERCIVITIES; DOPED SAMPLE; EXCHANGE BIAS; EXCHANGE-BIAS FIELDS; GRAIN SIZE; NIO FILMS; NIO THIN FILM; POLYCRYSTALLINE; RELAXATION MODELS; ROOM TEMPERATURE; SCREENING EFFECT; SPIN DENSITIES; THERMAL STABILITY; TRAINING EFFECTS; TRANSMISSION ELECTRON;

ATOMIC FORCE MICROSCOPY; DOPING (ADDITIVES); NANOPARTICLES; SPIN DYNAMICS; THERMODYNAMIC STABILITY; THIN FILMS; TRANSMISSION ELECTRON MICROSCOPY; X RAY DIFFRACTION ANALYSIS;

SILVER;

EID: 70449719445     PISSN: 03048853     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.jmmm.2009.10.012     Document Type: Article

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