The evaluation of thin electroless plated metal layers by means of surface plasmon resonance

2008 International Students and Young Scientists Workshop - Photonics and Microsystems, STYSW 2008

Volumn , Issue , 2008, Pages 23-27

  Herschel, R ^a   Schuster, T ^a   Schaffer C G ^a  

^a DRESDEN UNIVERSITY OF TECHNOLOGY   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

COMPLEX PERMITTIVITY; ELECTROLESS; FIBRE OPTIC; FURTHER DEVELOPMENT; IMPEDANCE MODELS; LAYER PARAMETERS; METAL LAYER; MULTI-LAYER SYSTEM; PLASMON EXCITATIONS; PLATED METALS; REFLECTIVITY VALUES; THIN METAL LAYERS;

APPROXIMATION THEORY; BIOSENSORS; MICROSYSTEMS; OPTICAL DATA STORAGE; PERMITTIVITY; PLASMONS; REFLECTION; SURFACE PLASMON RESONANCE;

METALS;

EID: 70449674916     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/STYSW.2008.5164135     Document Type: Conference Paper

References (12)

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