S2MP: Similarity measure for sequential patterns

Conferences in Research and Practice in Information Technology Series

Volumn 87, Issue , 2008, Pages 95-104

  Saneifar, Hassan ^a   Bringay, Sandra ^a   Laurent, Anne ^a   Teisseire, Maguelonne ^a  

^a LIRMM   (France)

Author keywords

Clustering; Clustering of Sequential Patterns; Data mining; S2mp; Sequential patterns; Similarity measure

Indexed keywords

CALCULATION TIME; CLUSTERING; COMPLEX SEQUENCES; EDIT DISTANCE; HOMOGENEOUS CLUSTER; S2MP; SEQUENTIAL DATA; SEQUENTIAL PATTERNS; SIMILARITY MEASURE;

INFORMATION TECHNOLOGY;

DATA MINING;

EID: 70449654668     PISSN: 14451336     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Article

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