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Journal of Physical Chemistry C

Volumn 113, Issue 42, 2009, Pages 18244-18250

In situ calorimetry at metal-electro de liquid electrolyte interfaces as monitored by probe beam deflection techniques

(2) Hai, Bin a Scherson, Daniel a

a CASE WESTERN RESERVE UNIVERSITY (United States)

Author keywords

[No Author keywords available]

Indexed keywords

AQUEOUS SOLUTIONS; AU ELECTRODES; AU OXIDES; COLLIMATED LASER BEAMS; ELECTROLYTE SOLUTIONS; EXPERIMENTAL CONDITIONS; EXPERIMENTAL DATA; IN-SITU; INTERFACIAL PROCESS; LIQUID ELECTROLYTES; METAL ELECTRODES; NUMERICAL SIMULATION; OPTICAL MEASUREMENT; PROBE BEAM DEFLECTION; VERY THIN FILMS;

COMPUTER SIMULATION; ELECTROLYTES; GOLD; MONOLAYERS; OPTICAL DATA PROCESSING; PROBES; SOLID STATE LASERS; SULFURIC ACID;

PHASE INTERFACES;

EID: 70449572414 PISSN: 19327447 EISSN: 19327455 Source Type: Journal
DOI: 10.1021/jp905551b Document Type: Article

Times cited : (6)

References (16)

1
- 0033906954
- Bidoia, E. D.; McLarnon, F.; Cairns, E. J. J. Electronal. Chem. 2000, 482, 75.
- (2000) J. Electronal. Chem. , vol.482 , pp. 75
- Bidoia, E.D.¹ McLarnon, F.² Cairns, E.J.³

2
- 0041437435
- Henderson, M. J.; Bitziou, E.; Hillman, A. R.; Vieil, E. J. Electrochem. Soc. 2001, 148, E105.
- (2001) J. Electrochem. Soc. , vol.148
- Henderson, M.J.¹ Bitziou, E.² Hillman, A.R.³ Vieil, E.⁴

3
- 4243979252
- Kotz, R.; Barbero, C.; Haas, O. Ber. Buns.-Gesell.-Phys. Chem. Chem. Phys. 1993, 97, 427.
- (1993) Ber. Buns.-Gesell.-Phys. Chem. Chem. Phys. , vol.97 , pp. 427
- Kotz, R.¹ Barbero, C.² Haas, O.³

4
- 33846227125
- Shi, P.; Fromondi, I.; Shi, Q. F.; Wang, Z. G.; Scherson, D. A. Anal. Chem- 2007, 79, 202.
- (2007) Anal. Chem , vol.79 , pp. 202
- Shi, P.¹ Fromondi, I.² Shi, Q.F.³ Wang, Z.G.⁴ Scherson, D.A.⁵

5
- 34547515635
- Wang, J.; Wang, Z.; Scherson, D. J. Eleetrochem. Soc. 2007, 154, F165.
- (2007) J. Eleetrochem. Soc. , vol.154
- Wang, J.¹ Wang, Z.² Scherson, D.³

6
- 70449590094
- Feldman, A. National Bureau of Standards Technical Note 933 1978, 53.
- (1978) National Bureau of Standards Technical Note , vol.933 , pp. 53
- Feldman, A.¹

7
- 0003419421
- John Wiley: New York
- Bialkowski, S. Photothermal Spectroscopy Methods for Chemical Analysis; John Wiley: New York, 1996.
- (1996) Photothermal Spectroscopy Methods for Chemical Analysis
- Bialkowski, S.¹

8
- 36849092760
- Schuster, R.; Rosch, R.; Timm, A. E. Z. Phys. Chem. 2007, 221, 1479.
- (2007) Z. Phys. Chem. , vol.221 , pp. 1479
- Schuster, R.¹ Rosch, R.² Timm, A.E.³

9
- 0000438925
- Stuckless, J. T.; Frei, N. A.; Campbell, C. T. Rev, Sci., Instrum. 1998, 69, 2427.
- (1998) Rev, Sci., Instrum. , vol.69 , pp. 2427
- Stuckless, J.T.¹ Frei, N.A.² Campbell, C.T.³

10
- 51149205514
- Boceara, A. C.; Fournier, D.; Badoz, J. Appl. Phys. Lett. 1980, 36, 130.
- (1980) Appl. Phys. Lett. , vol.36 , pp. 130
- Boceara, A.C.¹ Fournier, D.² Badoz, J.³

11
- 0019558533
- Jackson, W. B.; Amer, N. M.; Boceara, A. C.; Fournier, D. Appl. Opt.- 1981, 20, 1333.
- (1981) Appl. Opt. , vol.20 , pp. 1333
- Jackson, W.B.¹ Amer, N.M.² Boceara, A.C.³ Fournier, D.⁴

12
- 17444379141
- Schaaf, S. A. Q. Appl. Math. 1947, 5, 107.
- (1947) Q. Appl. Math. , vol.5 , pp. 107
- Schaaf, S.A.¹

13
- 70449590093
- accessed. Sept 10
- Valkó, P. http://library.wolfram.com/infocenter/MathSource/5026/, 2003 (accessed. Sept 10, 2009).
- (2009)
- Valkó, P.¹

14
- 70449587466
- accessed Sept 19
- http://www.comsol.com (accessed Sept 19, 2009).
- (2009)

15
- 0000692699
- Angersteinkozlowska, H.; Conway, B. E.; Hamelin, A.; Stoicoviciu, L. Electrochim. Acta 1986, 31, 1051.
- (1986) Electrochim. Acta , vol.31 , pp. 1051
- Angersteinkozlowska, H.¹ Conway, B.E.² Hamelin, A.³ Stoicoviciu, L.⁴

16
- 0003998388
- 63rd ed.; CRC Press: Boca Raton, FL
- Weast, R. C.; Astle, M. J. CRC Handbook of Chemistry and Physics, 63rd ed.; CRC Press: Boca Raton, FL, 1982; p D271.
- (1982) CRC Handbook of Chemistry and Physics
- Weast, R.C.¹ Astle, M.J.²

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