Deembedding accuracy for device scale and interconnection line parasitics

IEEE Microwave and Wireless Components Letters

Volumn 19, Issue 11, 2009, Pages 713-715

  Lee, Jaeho ^a   Lee, Jaehong ^a   Jeon, Jongwook ^a   Jhon, Hee Sauk ^a   Shin, Hyungcheol ^a  

^a Seoul National University   (South Korea)

Author keywords

Deembedding technique; Interconnection line parasitics; Open short (OS); Pad open short (POS); Rg; RF CMOS

Indexed keywords

DEEMBEDDING TECHNIQUE; INTERCONNECTION-LINE PARASITICS; OPEN-SHORT (OS); PAD-OPEN-SHORT (POS); RG; RF CMOS;

EQUIVALENT CIRCUITS;

EID: 70449532046     PISSN: 15311309     EISSN: None     Source Type: Journal    
DOI: 10.1109/LMWC.2009.2032011     Document Type: Article

References (11)

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