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Metrika
Volumn 71, Issue 1, 2009, Pages 59-77
A generalized correlated binomial distribution with application in multiple testing problems
Author keywords

Beta binomial model; Correlated binomial model; False discovery rates (FDR); Multiple testing
Indexed keywords

EID: 70449528763     PISSN: 00261335     EISSN: 1435926X     Source Type: Journal    
DOI: 10.1007/s00184-008-0202-7     Document Type: Article
Times cited : (12)
References (12)
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    • A direct approach to false discovery rates
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    • Estimation of false discovery rates in multiple testing: Application to gene microarray data
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* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.