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Volumn , Issue , 2007, Pages 175-203

Characterisation using x-ray photoelectron spectroscopy (XPS) and secondary ion mass spectrometry (SIMS)

Author keywords

[No Author keywords available]

Indexed keywords

MASS SPECTROMETRY; SECONDARY ION MASS SPECTROMETRY;

EID: 70449527413     PISSN: None     EISSN: None     Source Type: Book    
DOI: 10.1533/9781845693817.1.176     Document Type: Chapter
Times cited : (3)

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