Surface defects characterization with frequency and force modulation atomic force microscopy using molecular dynamics simulations

Current Applied Physics

Volumn 10, Issue 2, 2010, Pages 583-591

  Pishkenari, Hossein Nejat ^a   Meghdari, Ali ^a  

^a SHARIF UNIVERSITY OF TECHNOLOGY   (Iran)

Author keywords

Frequency and force modulation AFM; Molecular dynamics simulation; Optimum control scheme; System parameters effects on topography

Indexed keywords

AFM; AFM PROBE; CANTILEVER STIFFNESS; EXCITATION FORCE; FORCE MODULATION; FREQUENCY AND FORCE MODULATION AFM; GOLD-COATED; HORIZONTAL SCAN; INTERATOMIC POTENTIAL; MOLECULAR DYNAMICS SIMULATION; MOLECULAR DYNAMICS SIMULATIONS; ON-LINE IMAGING; OPTIMUM CONTROL SCHEME; QUALITY FACTORS; SET-POINT; SIMULATED SYSTEM; SYSTEM PARAMETERS EFFECTS ON TOPOGRAPHY;

ATOMS; DYNAMICS; MODULATION; MOLECULAR DYNAMICS; MOLECULAR MECHANICS; NANOCANTILEVERS; NONLINEAR CONTROL SYSTEMS; PROBES; SURFACE DEFECTS; TRANSITION METALS;

ATOMIC FORCE MICROSCOPY;

EID: 70449520466     PISSN: 15671739     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.cap.2009.08.002     Document Type: Article

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