EPSON: Enhanced physical security in OFDM networks

IEEE International Conference on Communications

Volumn , Issue , 2009, Pages

  Fangming, He ^a   Hong, Man ^a   Kivanc, Didem ^b   McNair, Brunce ^a  

^a STEVENS INSTITUTE OF TECHNOLOGY   (United States)

^b WEST VIRGINIA UNIVERSITY INSTITUTE OF TECHNOLOGY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

CHANNEL RESPONSE; COMMUNICATION NETWORKS; CRYPTOGRAPHIC SCHEMES; HIGH EFFICIENCY; LOW PROBABILITY OF DETECTIONS; MULTI-PATH COMPONENTS; MULTI-PATH FADING CHANNELS; MULTIPATH CHANNELS; OFDM NETWORKS; PHYSICAL PARAMETERS; PHYSICAL SECURITY; PILOT INFORMATION; SECURE WIRELESS COMMUNICATION; SECURITY MECHANISM; SIGNATURE INFORMATION; SIMULATION RESULT; WIDE BANDWIDTH; WIDEBAND CHANNEL; WIRELESS MEDIUM; WIRELESS TERMINALS;

COMMUNICATION; FADING (RADIO); FADING CHANNELS; ORTHOGONAL FREQUENCY DIVISION MULTIPLEXING; PROBABILITY DENSITY FUNCTION; WIRELESS TELECOMMUNICATION SYSTEMS;

WIRELESS NETWORKS;

EID: 70449476691     PISSN: 05361486     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/ICC.2009.5198999     Document Type: Conference Paper

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