Single-trial EEG data to classify type and intensity of facial emotion from P100 and N170

Proceedings of the International Joint Conference on Neural Networks

Volumn , Issue , 2009, Pages 3156-3163

  Utama, Nugraha P ^a   Takemoto, Atsushi ^b   Nakamura, Katsuki ^b   Koike, Yasuharu ^a  

^a TOKYO INSTITUTE OF TECHNOLOGY   (Japan)

^b NATIONAL INSTITUTE OF NEUROSCIENCE   (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

BRAIN SIGNALS; FACIAL EMOTIONS; HIGH INTENSITY; INTENSITY LEVELS; SINGLE-TRIAL EEG;

NEURAL NETWORKS; WINDOWS;

ELECTROENCEPHALOGRAPHY;

EID: 70449455527     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/IJCNN.2009.5178818     Document Type: Conference Paper

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