Control-oriented hysteresis models for magnetic electron lenses

IEEE Transactions on Magnetics

Volumn 45, Issue 11, 2009, Pages 5235-5238

  Van Bree, P J ^a   Van Lierop, C M M ^a   Van Den Bosch, P P J ^a  

^a EINDHOVEN UNIVERSITY OF TECHNOLOGY   (Netherlands)

Author keywords

Control systems; Electron microscopy; Hysteresis; Limit cycles; Magnetic field measurement; Magnetic hysteresis; Modeling; Time domain measurements

Indexed keywords

CONTROL SYSTEMS; CURVE FITTING; ELECTRON MICROSCOPES; ELECTRON MICROSCOPY; HYSTERESIS; HYSTERESIS LOOPS; MAGNETIC FIELD MEASUREMENT; MAGNETIC HYSTERESIS; MAGNETIC LENSES; MODELS;

EXPERIMENT DESIGN; HYSTERESIS MODELS; LIMIT-CYCLE; LOCAL MEMORY; MAGNETIC ELECTRON LENS; MATHEMATICAL ANALYSIS; SELECTION PROCEDURES; TIME DOMAIN MEASUREMENT;

MAGNETISM;

EID: 70449429194     PISSN: 00189464     EISSN: None     Source Type: Journal    
DOI: 10.1109/TMAG.2009.2031081     Document Type: Article

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