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Volumn , Issue , 2009, Pages

Assessment of electrically conductive textiles for use in EMC applications

Author keywords

Conductive textiles; Shielding effectiveness; Surface resistivity

Indexed keywords

COAXIAL TRANSMISSION; CONDUCTIVE TEXTILES; ELECTRICALLY CONDUCTIVE; EXPERIMENTAL PROCEDURE; SHIELDING EFFECTIVENESS; SIMPLE METHOD; SURFACE RESISTIVITY;

EID: 70449403636     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/EMCEUROPE.2009.5189690     Document Type: Conference Paper
Times cited : (5)

References (6)
  • 1
    • 33845652672 scopus 로고    scopus 로고
    • Calculating the surface resistivity of conductive fabric
    • A. Henn, "Calculating the surface resistivity of conductive fabric," Interference Technology Magazine ITEM Update,pp. 6672, 1998.
    • (1998) Interference Technology Magazine ITEM Update , pp. 6672
    • Henn, A.1
  • 3
    • 33846805570 scopus 로고    scopus 로고
    • Fabrication of conductive woven fabric and analysis of electromagnetic shielding via measurement and empirical equation
    • Apr
    • H. Chen, K. Lee, J. Lin, and M. Koch, "Fabrication of conductive woven fabric and analysis of electromagnetic shielding via measurement and empirical equation," Journal of Materials Processing Technology,vol. 184, pp. 124-30, Apr. 2007.
    • (2007) Journal of Materials Processing Technology , vol.184 , pp. 124-130
    • Chen, H.1    Lee, K.2    Lin, J.3    Koch, M.4
  • 4
    • 0013429453 scopus 로고    scopus 로고
    • Standard test method for measuring the electromagnetic shielding effectiveness of planar materials
    • ASTM D4935, USA
    • ASTM D4935, "Standard test method for measuring the electromagnetic shielding effectiveness of planar materials," USA 1999.
    • (1999)
  • 5
    • 70449375869 scopus 로고    scopus 로고
    • IEEE Std 299, IEEE standard method for measuring the effectiveness of electromagnetic shielding enclosures, New York, USA 2006.
    • IEEE Std 299, "IEEE standard method for measuring the effectiveness of electromagnetic shielding enclosures," New York, USA 2006.
  • 6
    • 70449352465 scopus 로고    scopus 로고
    • National Instruments Corporation, LabViewv. 8.2. National Instruments Corporation, 2007.
    • National Instruments Corporation, LabViewv. 8.2. National Instruments Corporation, 2007.


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.