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Volumn 11, Issue 4, 2009, Pages

An improved procedure for fringe-locked photorefractive running hologram data processing

Author keywords

Diffraction efficiency; Fringe locked holograms; Photorefractive materials

Indexed keywords

APPLIED ELECTRIC FIELD; DEBYE SCREENING LENGTH; DEGREE OF UNCERTAINTY; DIFFUSION LENGTH; EXPERIMENTAL DATA; FRINGE-LOCKED HOLOGRAMS; PHOTO-EXCITATIONS; PHOTO-REFRACTIVE; TIO;

EID: 70449372491     PISSN: 14644258     EISSN: 17413567     Source Type: Journal    
DOI: 10.1088/1464-4258/11/4/045201     Document Type: Article
Times cited : (4)

References (21)


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.