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Volumn 11, Issue 4, 2009, Pages
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An improved procedure for fringe-locked photorefractive running hologram data processing
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Author keywords
Diffraction efficiency; Fringe locked holograms; Photorefractive materials
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Indexed keywords
APPLIED ELECTRIC FIELD;
DEBYE SCREENING LENGTH;
DEGREE OF UNCERTAINTY;
DIFFUSION LENGTH;
EXPERIMENTAL DATA;
FRINGE-LOCKED HOLOGRAMS;
PHOTO-EXCITATIONS;
PHOTO-REFRACTIVE;
TIO;
DATA PROCESSING;
DIFFRACTION EFFICIENCY;
ELECTRIC FIELDS;
LITHOGRAPHY;
PHOTOREACTIVITY;
PHOTOREFRACTIVE MATERIALS;
HOLOGRAMS;
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EID: 70449372491
PISSN: 14644258
EISSN: 17413567
Source Type: Journal
DOI: 10.1088/1464-4258/11/4/045201 Document Type: Article |
Times cited : (4)
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References (21)
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