Using I-TOF spectrometry to measure photon energies at FELs

Journal of Instrumentation

Volumn 4, Issue 9, 2009, Pages

  Juranic N ^a   Martins, M ^b   Viefhaus, J ^a   Bonfigt, S ^a   Jahn, L ^b   Ilchen, M ^a   Klumpp, S ^b   Tiedtke, K ^a  

^a DESY   (Germany)

^b UNIVERSITY OF HAMBURG   (Germany)

Author keywords

Beam intensity monitors; Beam line instrumentation (beam position and profile monitors; Bunch length monitors); Gaseous detectors; Instrumentation for FEL; Ionization and excitation processes

Indexed keywords

BUNCH LENGTH; EXCITATION PROCESS; GASEOUS DETECTORS; MEASUREMENT METHODS; MOLECULAR RESONANCES; PROFILE MONITOR; REAL-TIME FEEDBACK; STOCHASTIC NATURE;

FREE ELECTRON LASERS; INERT GASES; IONIZATION OF GASES; PHOTOIONIZATION; SPECTROMETERS;

PHOTONS;

EID: 70449371865     PISSN: 17480221     EISSN: 17480221     Source Type: Journal    
DOI: 10.1088/1748-0221/4/09/P09011     Document Type: Article

References (16)

1. J. Pflüger 2000 Undulators for SASE FEL's, Nucl. Instrum. Meth. A 445 366
2. V. Ayvazyan et al. 2006 First operation of a free-electron laser generating GW power radiation at 32 nm wavelength, Eur. Phys. J. D 37 297
3. W. Ackermann et al. 2007 Operation of a free-electron laser from the exterme ultraviolet to the weater window, Nat. Photonics 1 336
4. K. Tiedtke et al. 2009 The soft x-ray free-electron laser FLASH at DESY: beamlines, diagnostics and end-stations, New J. Phys. 11 023029
5. M. Wellhöfer et al. 2008 Photoelectron spectroscopy as a non-invasive method to monitor the SASE-FEL spectra, JINST 3 P02003
6. K. Tiedtke et al. 2008 Gas detectors for x-ray lasers, J. Appl. Phys. 103 094511
7. J.M. Bizau and F.J. Wuilleumier 1995 Redetermination of absolute partial photoionization cross section of He and Ne atoms between 20 and 300 eV photon energy, J. Electron Spectrosc. 71 205
8. I.H. Suzuki and N. Saito 1992 γ-value in rare gases for soft x-ray absolute maeasurement, ETL Tech. Rep. 56 687
9. R.J. Bartlett et al. 1992 Single-photon double ionization of He and Ne, Phys. Rev. A 46 5574
10. T.N. Chang and R.T. Poe 1975 Double photoionizaton of neon, Phys. Rev. A 12 1432
11. S.L. Carter and H.P. Kelly 1977 Double photoionizaton of neon and argon, Phys. Rev. A 16 1525
12. W.C. Wiley and I.H. McLaren, Time-of-flight mass spectrometer with improved resolution, Rev. Sci. Instrum. 26 1955 1150
13. C.U.S. Larsson et al. 1994 First results from the high resolution XUV undulator beamline BW3 at HASYLAB, Nucl. Instrum. Meth. A 337 603
14. R. Reininger and V. Saile 1990 A soft x-ray grating monochromator for undulator radiation, Nucl. Instrum. Meth. A 288 343
15. A.R.B. de Castro and R. Reininger 1992 Optimization of undulators for a SX-700 instrument: finite element coupled to ray tracing, Rev. Sci. Instrum. 63 1317
16. 4,5 edges of xenon, using electron impact with high resolution, J. Phys. B 10 2479