Silicon physical unclonable function resistant to a 1025-trial brute force attack in 90 nm CMOS

IEEE Symposium on VLSI Circuits, Digest of Technical Papers

Volumn , Issue , 2009, Pages 116-117

  Stanzione, S ^a   Iannaccone, G ^a  

^a UNIVERSITY OF PISA   (Italy)

Author keywords

[No Author keywords available]

Indexed keywords

90NM CMOS; ACCELERATED AGING; ANALOG SIGNAL PROCESSING; BRUTE-FORCE ATTACK; EXPERIMENTAL MEASUREMENTS; PHYSICAL UNCLONABLE FUNCTIONS; POWER CONSUMPTION; PROCESS VARIABILITY; TEMPERATURE MONITOR;

SIGNAL PROCESSING;

VLSI CIRCUITS;

EID: 70449359528     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (5)

1. R. Pappu, et al, "Physical one-way functions", Science, vol. 297, pp. 2026-2030, 2002.
2. K. Lofstrom, W. R. Daasch, D. Taylor, "IC identification circuit using device mismatch", IEEE-ISSCC 2000, Digest Tech. Papers, pp. 372-373, 2000.
3. J. W. Lee, et al, "A technique to build a secret key in integrated circuits for identification and authentication application", 2004 Symposium On VLSI Circuits, pp. 176-179, 2004.
4. G. E. Suh and S. Devadas, "Physical unclonable functions for device authentication and secret key generation", Proc. DAC 2007, pp. 9-14, June 4-8, 2007.
5. D. Puntin, S. Stanzione, G. Iannaccone, "CMOS unclonable system for secure authentication based on device variability", Proc. ESSCIRC 2008, pp. 130-133, Edinburgh, 2008.