Effects of a conducting LaNiO3 thick film as a buffer layer of a Pb(Zr,Ti)O3 film on Titanium substrates

International Journal of Applied Ceramic Technology

Volumn 6, Issue 6, 2009, Pages 687-691

  Choi, Jong Jin ^a   Ryu, Jungho ^a   Hahn, Byung Dong ^a   Yoon, Woon Ha ^a   Park, Dong Soo ^a  

^a Korea Institute of Material Science   (South Korea)

Author keywords

[No Author keywords available]

Indexed keywords

AEROSOL DEPOSITION; LEAD ZIRCONATE TITANATE; PB(ZR ,TI)O; POST ANNEALING; PZT FILM; RELATIVE DIELECTRIC CONSTANT; REMNANT POLARIZATIONS; TI SUBSTRATES; TITANIUM SUBSTRATES;

BUFFER LAYERS; LEAD; PIEZOELECTRIC ACTUATORS; PIEZOELECTRIC MATERIALS; PIEZOELECTRIC TRANSDUCERS; SEMICONDUCTING LEAD COMPOUNDS; THICK FILMS; TITANIUM; ZIRCONIUM;

SUBSTRATES;

EID: 70449344649     PISSN: 1546542X     EISSN: 17447402     Source Type: Journal    
DOI: 10.1111/j.1744-7402.2008.02333.x     Document Type: Article

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