SEU mitigation-using 1/3 rate convolution coding

Proceedings - 2009 2nd IEEE International Conference on Computer Science and Information Technology, ICCSIT 2009

Volumn , Issue , 2009, Pages 180-183

  Rastogi, Aabhas ^a   Agarawal, Manu ^a   Gupta, Bhawna ^a  

^a JAYPEE INSTITUTE OF INFORMATION TECHNOLOGY   (India)

Author keywords

Bit error rate (BER); Error detection and correction coding (EDAC); First in first out FIFO; Single event upset (SEU)

Indexed keywords

BIT ERROR RATE (BER); BIT-FLIPS; CONVOLUTION CODES; CONVOLUTION CODING; ERROR DETECTION AND CORRECTION CODING (EDAC); FABRICATION TECHNOLOGIES; FIRST IN FIRST OUT FIFO; MEMORY SYSTEMS; RADIATION-INDUCED; SINGLE EVENT UPSET (SEU); SOFT ERROR; TEMPORARY FAULT;

COMPUTER SCIENCE; CONVOLUTION; ELECTRIC NETWORK ANALYSIS; ERROR CORRECTION; ERROR DETECTION; INFORMATION TECHNOLOGY; URANIUM POWDER METALLURGY;

BIT ERROR RATE;

EID: 70449102825     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/ICCSIT.2009.5234740     Document Type: Conference Paper

References (6)

1. Allan. H. Johnston, Scaling and Technology Issues for Soft Error Rates, 4th Annual Research Conference on Reliability, Stanford University, Oct. 2000
2. F. Lima Kanstensmidt, L. Carro, R. Reis, Fault tolerant techniques for SRAM-based FPGAs, Springer, 2006.
3. Ajay Dholakia, Introduction to convolutional codes with applications, Kluwer Academic Publishers, 1994.
4. Viterbi.J, "Error Bounds for Convolutional Codes and an Asymptotically Optimum Decoding Algorithm," IEEE Transactions on Information Theory, Vol.13, April, 1967, pp. 260-269.
5. th Volume Issue,25-29 May
6. D.J.C. MacKay, Information Theory, Inference, and Learning Algorithms, Cambridge University Press, 2003.