Observation of step configuration conversion on single-domain Si(001) 1 × 2 surface by scanning tunneling microscope

Applied Physics Letters

Volumn 69, Issue 22, 1996, Pages 3336-3338

  Zhou, J M ^a   Lin, N ^b   Guo, L W ^a   Zhang, M H ^a   Huang, Q ^a   Cue, N ^b   Chen, T ^b  

^a INSTITUTE OF PHYSICS   (China)

^b HONG KONG UNIVERSITY OF SCIENCE AND TECHNOLOGY   (Hong Kong)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 7044224864     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.117298     Document Type: Article

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