PIXE analysis of a painting by Giorgio Vasari

X-Ray Spectrometry

Volumn 38, Issue 4, 2009, Pages 301-307

  Grassi, N ^a   Bonanni, P ^a   Mazzotta, C ^a   Migliori, A ^a   Mand, P A ^a  

^a UNIVERSITY OF FLORENCE   (Italy)

Author keywords

[No Author keywords available]

Indexed keywords

BEAM-LINES; CULTURAL HERITAGES; ELEMENTAL COMPOSITIONS; FLORENCE; ION BEAM ANALYSIS TECHNIQUES; NON DESTRUCTIVE; PARTICLE INDUCED X-RAY EMISSION; PARTICLE INDUCED X-RAY EMISSION ANALYSIS; PARTICLE-INDUCED X-RAY EMISSION ANALYSIS; TANDETRON ACCELERATORS;

ION BEAMS;

EID: 70350784295     PISSN: 00498246     EISSN: 10974539     Source Type: Journal    
DOI: 10.1002/xrs.1181     Document Type: Article

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