The system Ga-Ni: A new investigation of the Ga-rich part

Intermetallics

Volumn 18, Issue 2, 2010, Pages 277-285

  Schmetterer, Clemens ^a   Flandorfer, Hans ^a   Lengauer, Christian L ^a   Bros, Jean Pierre ^b   Ipser, Herbert ^a  

^a UNIVERSITY OF VIENNA   (Austria)

^b AIX MARSEILLE UNIVERSITÉ   (France)

Author keywords

A. Intermetallics, miscellaneous; B. Phase diagrams; B. Phase identification

Indexed keywords

A. INTERMETALLICS, MISCELLANEOUS; ATOMIC PARAMETER; B. PHASE DIAGRAMS; B. PHASE IDENTIFICATION; CALORIMETRIC TECHNIQUES; EPMA; INTEGRAL ENTHALPIES; NI ALLOYS; PERITECTIC REACTION; POWDER X RAY DIFFRACTION; RICH PHASE; SINGLE CRYSTAL X-RAY DIFFRACTION; TEMPERATURE DEPENDENCE; X-RAY POWDER;

CRYSTAL ATOMIC STRUCTURE; DIFFRACTION; ELECTRON PROBE MICROANALYSIS; GALLIUM; INTERMETALLICS; NICKEL; PALLADIUM; PHASE DIAGRAMS; X RAY DIFFRACTION; X RAY DIFFRACTION ANALYSIS;

GALLIUM ALLOYS;

EID: 70350763860     PISSN: 09669795     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.intermet.2009.07.024     Document Type: Article

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