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Volumn 106, Issue 8, 2009, Pages

Formation of defects in boron nitride by low energy ion bombardment

Author keywords

[No Author keywords available]

Indexed keywords

CORE LEVELS; CUBIC PHASE; HEXAGONAL PHASE; HIGH-RESOLUTION MEASUREMENTS; INTERSTITIAL POSITIONS; INTERSTITIALS; LOW ENERGIES; MOLECULAR NITROGEN; NEAR EDGE X RAY ABSORPTION FINE STRUCTURE; NITROGEN BOMBARDMENT; NITROGEN VACANCIES; PHOTOEMISSION SPECTRA; THEORETICAL PREDICTION; VIBRATIONAL FINE STRUCTURE;

EID: 70350735771     PISSN: 00218979     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.3253576     Document Type: Article
Times cited : (43)

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* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.