Advantages of admittance spectroscopy over time-of-flight technique for studying dispersive charge transport in an organic semiconductor

Journal of Applied Physics

Volumn 106, Issue 8, 2009, Pages

  Tsung, K K ^a   So, S K ^a  

^a HONG KONG BAPTIST UNIVERSITY   (Hong Kong)

Author keywords

[No Author keywords available]

Indexed keywords

ADMITTANCE SPECTROSCOPIES; CARRIER DISPERSION; CHARGE TRANSPORT; CHARGE TRANSPORT PROPERTIES; DEEP TRAPS; DISPERSIVE MATERIALS; HOLE TRANSPORTS; MOBILITY EXTRACTION; ORGANIC SEMICONDUCTOR; SHALLOW TRAPS; SHARP CONTRAST; TIME OF FLIGHT; TIME-OF-FLIGHT TECHNIQUES; TRANSIT TIME;

AMINES; ELECTRIC ADMITTANCE; MATERIALS PROPERTIES; SEMICONDUCTING ORGANIC COMPOUNDS;

TRANSPORT PROPERTIES;

EID: 70350732619     PISSN: 00218979     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.3251409     Document Type: Article

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