Analysis and mitigation of process variation impacts on power-attack tolerance

Proceedings - Design Automation Conference

Volumn , Issue , 2009, Pages 238-243

  Lin, Lang ^a   Burleson, Wayne ^a  

^a University of Massachusetts   (United States)

Author keywords

Differential power analysis; Monte Carlo simulation; Process variation; Transistor sizing

Indexed keywords

CMOS INTEGRATED CIRCUITS; COMPUTER AIDED DESIGN; INTELLIGENT SYSTEMS; MONTE CARLO METHODS; SPICE;

CMOS TECHNOLOGY; COMPONENT IMPLEMENTATIONS; DIFFERENTIAL POWER ANALYSIS; IMPLEMENTATION ATTACKS; PROCESS VARIATION; SPICE CIRCUIT SIMULATION; STATISTICAL PROPERTIES; TRANSISTOR SIZING;

SIDE CHANNEL ATTACK;

EID: 70350724703     PISSN: 0738100X     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1145/1629911.1629977     Document Type: Conference Paper

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