Electric force microscopy investigations of barrier formations in ZnO-based varistors

Journal of the European Ceramic Society

Volumn 30, Issue 2, 2010, Pages 549-554

  Gheno, S M ^a   Kiminami, R H G A ^a   Morelli, M R ^a   Paulin Filho, P I ^a  

^a FEDERAL UNIVERSITY OF SÃO CARLOS   (Brazil)

Author keywords

Electrical properties; Grain boundaries; Varistors; ZnO

Indexed keywords

APPLIED VOLTAGES; BARRIER FORMATION; ELECTRIC FIELD DISTRIBUTIONS; ELECTRIC FORCE MICROSCOPY; ELECTRICAL BEHAVIORS; ELECTRICAL PROPERTIES; ELECTRICAL RESISTANCES; ELECTRONIC CERAMIC; INSULATING LAYERS; METAL-OXIDE VARISTOR; NONLINEAR PROPERTIES; POLYCRYSTALLINE; SCHOTTKY BARRIERS; ZNO;

ATOMIC FORCE MICROSCOPY; CERAMIC MATERIALS; COPPER OXIDES; ELECTRIC FIELDS; GRAIN BOUNDARIES; GRAIN SIZE AND SHAPE; POLYCRYSTALLINE MATERIALS; SCHOTTKY BARRIER DIODES; SEMICONDUCTING ZINC COMPOUNDS; VARISTORS; ZINC OXIDE;

ELECTRIC PROPERTIES;

EID: 70350719658     PISSN: 09552219     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.jeurceramsoc.2009.05.039     Document Type: Article

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