Time delay integration and in-pixel spatiotemporal filtering using a nanoscale digital CMOS focal plane readout

IEEE Transactions on Electron Devices

Volumn 56, Issue 11, 2009, Pages 2516-2523

  Tyrrell, Brian ^a   Anderson, Kirk ^a   Baker, Justin ^a   Berger, Robert ^a   Brown, Matthew ^a   Colonero, Curtis ^a   Costa, Joseph ^a   Holford, Brian ^a   Kelly, Michael ^a   Ringdahl, Eric ^a   Schultz, Kenneth ^a   Wey, James ^a  

^a MASSACHUSETTS INSTITUTE OF TECHNOLOGY   (United States)

Author keywords

Image processing; Imaging; Infrared image sensors; Infrared surveillance; Infrared tracking

Indexed keywords

APPLICATION EXAMPLES; CMOS TECHNOLOGY; CUTOFF WAVELENGTHS; DETECTOR ARRAYS; DIGITAL CMOS; FOCAL PLANE; IMAGE STABILIZATION; IMAGING; INFRARED IMAGE SENSORS; INFRARED SURVEILLANCE; INFRARED TRACKING; LONGWAVE INFRARED; MEASURED DATA; NANO SCALE; OPERATING TEMPERATURE; PERFORMANCE METRICS; PIXEL PROCESSING; READOUT INTEGRATED CIRCUITS; REAL-TIME DIGITAL SIGNAL PROCESSING; SPATIO TEMPORAL FILTERING; TIME DELAY INTEGRATION; VELOCIMETRY; WIDE FIELD IMAGING;

ANALOG TO DIGITAL CONVERSION; CELLULAR NEURAL NETWORKS; CMOS INTEGRATED CIRCUITS; DELAY CIRCUITS; DIGITAL IMAGE STORAGE; EDGE DETECTION; FOCUSING; IMAGE PROCESSING; IMAGE SENSORS; IMAGING SYSTEMS; INFRARED IMAGING; INTEGRATED CIRCUITS; MERCURY (METAL); SIGNAL PROCESSING; SOLID-STATE SENSORS; TELLURIUM COMPOUNDS;

PIXELS;

EID: 70350714237     PISSN: 00189383     EISSN: None     Source Type: Journal    
DOI: 10.1109/TED.2009.2030719     Document Type: Article

References (6)

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