A novel low-power readout structure for TDI ROIC

IEEE International Symposium on Semiconductor Manufacturing Conference Proceedings

Volumn 1, Issue , 2003, Pages 591-594

  Wengao, Lu ^a   Jun, Gao ^a   Zhongjian, Chen ^a   Jing, Liu ^a   Wentao, Cui ^a   Ju, Tang ^a   Lijiu, Ji ^a  

^a PEKING UNIVERSITY   (China)

Author keywords

CMOS; FBAR; ROIC

Indexed keywords

CMOS INTEGRATED CIRCUITS;

CHIP POWER; CMOS TECHNOLOGY; FAST READOUT; FBAR STRUCTURES; HIGH-PERFORMANCE CMOS; READ-OUT STRUCTURES; READOUT INTEGRATED CIRCUITS; SETTLING TIME;

ELECTRIC LOSSES;

EID: 70350703771     PISSN: 1523553X     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/ICASIC.2003.1277618     Document Type: Conference Paper

References (8)

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