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Optics Letters

Volumn 34, Issue 21, 2009, Pages 3415-3417

Two-beam SPIDER for dual-pulse single-shot characterization

(3) French, Doug a Dorrer, Christophe b Jovanovic, Igor a

a PURDUE UNIVERSITY (United States)

b UNIVERSITY OF ROCHESTER (United States)

Author keywords

[No Author keywords available]

Indexed keywords

ELECTRIC FIELD MEASUREMENT; ELECTRIC FIELDS; ULTRAFAST LASERS; ULTRAFAST PHENOMENA;

INNOVATIVE DESIGN; MATERIAL DISPERSIONS; NONLINEAR EFFECT; PULSE-TO-PULSE VARIATIONS; SIMULTANEOUS MEASUREMENT; SINGLE SHOT MODES; SPECTRAL PHASE INTERFEROMETRY FOR DIRECT ELECTRIC FIELD; ULTRAFAST LASER SYSTEMS;

ULTRASHORT PULSES;

EID: 70350634221 PISSN: 01469592 EISSN: 15394794 Source Type: Journal
DOI: 10.1364/OL.34.003415 Document Type: Article

Times cited : (20)

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