A time-domain sub-micro watt temperature sensor with digital set-point programming

IEEE Sensors Journal

Volumn 9, Issue 12, 2009, Pages 1639-1646

  Chen, Poki ^a   Chen, Tuo Kuang ^a,b   Wang, Yu Shin ^a   Chen, Chun Chi ^a,c  

^a NATIONAL TAIWAN UNIVERSITY OF SCIENCE AND TECHNOLOGY   (Taiwan)

^b Novatek Microelectronics Corp Ltd   (Taiwan)

^c NATIONAL KAOHSIUNG UNIVERSITY OF APPLIED SCIENCES   (Taiwan)

Author keywords

Delay line; Intelligent temperature sensor; On chip thermal sensing; Set point programming; Smart temperature sensor; Thermostat (temperature switch)

Indexed keywords

DELAY LINE; INTELLIGENT TEMPERATURE SENSOR; ON-CHIP THERMAL SENSING; SET-POINT PROGRAMMING; SMART TEMPERATURE SENSOR;

BIPOLAR TRANSISTORS; COMPARATORS (OPTICAL); DYNAMIC RANDOM ACCESS STORAGE; ELECTRIC DELAY LINES; ELECTRIC POWER UTILIZATION; MULTIPLEXING; MULTIPLEXING EQUIPMENT; THERMOSTATS; TIME DOMAIN ANALYSIS; VLSI CIRCUITS; WAVES;

TEMPERATURE SENSORS;

EID: 70350633959     PISSN: 1530437X     EISSN: None     Source Type: Journal    
DOI: 10.1109/JSEN.2009.2029035     Document Type: Article

References (23)

1. M. A. P. Pertijs, A. Bakker, and J. H. Huijsing, "A high-accuracy temperature sensor with second-order curvature correction and digital bus interface," in Proc. IEEE ISCAS, May 2001, vol.1, pp. 368-371.
2. G. Wang and G. C. M. Meijer, "The temperature characteristics of bipolar transistors fabricated in CMOS technology," Sens. Actuat., vol.87, pp. 81-89, Dec. 2000.
3. M. Tuthill, "A switched-current, switched- capacitor temperature sensor in 0.6- CMOS," IEEE J. Solid-State Circuits, vol.33, pp. 1117-1122, Jul. 1998.
4. G. C. M. Meijer, G. Wang, and F. Fruett, "Temperature sensors and voltage implemented in CMOS technology," IEEE Sensors J., vol.1, pp. 225-234, Oct. 2001.
5. K. Arabi and B. Kaminska, "Built-in temperature sensors for on-line thermal monitoring of microelectronic structures," IEEE Computer Design: VLSI in Computers and Processors, ICCD, pp. 462-467, Oct. 1997.
6. V. Szekely, C. Marta, Z. Kohari, and M. Rencz, "CMOS sensors for on-line thermal monitoring of VLSI circuits," IEEE Trans. Very Large Scale Integration (VLSI) Syst., vol.5, pp. 270-276, Sep. 1997.
7. A. Paul Brokaw, "A temperature sensor with single resistor set-point programming," IEEE J. Solid-State Circuits, vol.31, pp. 1908-1915, Dec. 1999.
8. 2 high-precision temperature switch," in Proc. ESSCIRC, Sep. 2001, pp. 77-80.
9. T. Yasuda, "On-chip temperature sensor with high tolerance for process and temperature variation," in Proc. IEEE ISCAS, May 2005, pp. 1024-1027.
10. T. A. Demassa and Z. Ciccone, Digital Integrated Circuits. New York: Wiley, 1996.
11. I. M. Filanovsky and A. Allam, "Mutual compensation of mobility and threshold voltage temperature effects with applications in CMOS circuits," IEEE Trans. Circuits Syst. I, vol.48, no.7, pp. 876-884, Jul. 2001.
12. Y. Tsividis, Operation and Modeling of the MOS Transistor, 2nd ed. Oxford, U.K.: Oxford Univ. Press, 2003.
13. M. Pelgrom, H. Tuinhout, and M. Vertregt, "Transistor matching in analog CMOS applications," in IEEE IEDM Tech. Dig., Dec. 1998, pp. 915-918.
14. C. W. Branson, "Integrated pin electronics for a VLSI test system," IEEE Trans. Ind. Electron., vol.36, pp. 185-191, May 1989.
15. R.-J. Yang, K.-H. Chao, S. C. Hwu, C.-K. Liang, and S.-L. Liu, "A 155.52 Mbps-3.125 Gbps continuous-rate clock and data recovery circuit," IEEE J. Solid-State Circuits, vol.41, pp. 1380-1390, Jun. 2006.
16. Y.-L. Tsao, M.-C. Chung, and S.-J. Jou, "Delay-difference DLL and its application on skewed output buffers," in Proc. IEEE Asia-Pacific Conf. ASIC, Aug. 2002, pp. 279-282.
17. G. C. Moyer,M. Clements, W.-T. Liu, T. Schaffer, and R. K. Cavin, III, "The delay vernier pattern generation technique," IEEE J. Solid-State Circuits, vol.32, pp. 551-562, Apr. 1997.
18. P. Dudek, S. Szczepanski, and J. V. Hatfield, "A high-resolution CMOS time-to-digital converter utilizing a Vernier delay line," IEEE J. Solid-State Circuits, vol.35, pp. 240-247, Feb. 2000.
19. A. Bakker, "CMOS smart temperature sensors - An overview," in Proc. IEEE Sensors, Jun. 2002, vol.2, pp. 1423-1427.
20. J. A. Gasbarro and M. A. Horowitz, "Integrated pin electronics for VLSI functional testers," IEEE J. Solid-State Circuits, vol.24, pp. 331-337, Apr. 1989.
21. C.-H. Lin and K. Bult, "A 10-b, 500-M Sample/s CMOS DAC in 0.6 ," IEEE J. Solid-State Circuits, vol.33, pp. 1948-1958, Dec. 1998.
22. P. Chen, C.-C. Chen, W.-F. Lu, and C.-C. Tsai, "A time-to-digitalconverter- based CMOS smart temperature sensor," IEEE J. Solid-State Circuits, vol.40, pp. 1642-1648, Aug. 2005.
23. P. Chen, C.-C. Chen, T.-K. Chen, and S.-W. Chen, "A time-domain mixed-mode temperature sensor with digital set-point programming," in Proc. IEEE CICC, Sep. 2006, pp. 821-824.