Application of wavelet analysis in optical coherence tomography for obscured pattern recognition

Laser Physics Letters

Volumn 6, Issue 12, 2009, Pages 892-895

  Buranachai, C ^a   Thavarungkul, P ^a   Kanatharanaa, P ^a   Meglinski, I V ^b,c  

^a PRINCE OF SONGKLA UNIVERSITY   (Thailand)

^b CRANFIELD UNIVERSITY   (United Kingdom)

^c UNIVERSITY OF OTAGO   (New Zealand)

Author keywords

Optical coherence tomography; Pattern recognition; Wavelet analysis

Indexed keywords

EID: 70350633582     PISSN: 16122011     EISSN: None     Source Type: Journal    
DOI: 10.1002/lapl.200910089     Document Type: Article

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