Epitomic location recognition

IEEE Transactions on Pattern Analysis and Machine Intelligence

Volumn 31, Issue 12, 2009, Pages 2158-2167

  Ni, Kai ^a   Kannan, Anitha ^b   Criminisi, Antonio ^c   Winn, John ^c  

^a Georgia Institute of Technology   (United States)

^b MICROSOFT RESEARCH   (United States)

^c MICROSOFT RESEARCH   (United Kingdom)

Author keywords

Epitomic image analysis; Location class recognition; Panoramic stitching

Indexed keywords

COMPUTATIONAL PERFORMANCE; EPITOMIC IMAGE ANALYSIS; GENERATIVE MODEL; GEOMETRIC STRUCTURE; HIGH EFFICIENCY; LABELED IMAGES; LAMBERTIAN; LOCATION RECOGNITION; MODEL TRANSLATION; NOVEL METHODS; PANORAMIC STITCHING; RECOGNITION ACCURACY; SCALE INVARIANCE; STATE OF THE ART; VISUAL FEATURE;

IMAGE ANALYSIS;

EID: 70350618784     PISSN: 01628828     EISSN: None     Source Type: Journal    
DOI: 10.1109/TPAMI.2009.165     Document Type: Conference Paper

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