메뉴 건너뛰기




Volumn 5695 LNCS, Issue , 2009, Pages 86-94

Adaptive dispatching of incidences based on reputation for SCADA systems

Author keywords

Critical control systems; Reputation; SCADA systems

Indexed keywords

CRITICAL CONTROL SYSTEMS; HUMAN OPERATOR; REPUTATION;

EID: 70350600944     PISSN: 03029743     EISSN: 16113349     Source Type: Book Series    
DOI: 10.1007/978-3-642-03748-1_9     Document Type: Conference Paper
Times cited : (6)

References (17)
  • 1
    • 33846834126 scopus 로고    scopus 로고
    • A Survey of Trust and Reputation Systems for Online Service Provision
    • Jøsang, A., Ismail, R., Boyd, C.: A Survey of Trust and Reputation Systems for Online Service Provision. Decision Support Systems 43(2), 618-644 (2007)
    • (2007) Decision Support Systems , vol.43 , Issue.2 , pp. 618-644
    • Jøsang, A.1    Ismail, R.2    Boyd, C.3
  • 3
    • 85084140752 scopus 로고    scopus 로고
    • Cardenas, A., Amin, S., Sastry, S.: Research Challenges for the Security of Control Systems. In: HotSec 2008 (2008)
    • Cardenas, A., Amin, S., Sastry, S.: Research Challenges for the Security of Control Systems. In: HotSec 2008 (2008)
  • 4
    • 39749142098 scopus 로고    scopus 로고
    • Analyzing Cross-Sector Interdependencies. In: IEEE Computer Society, HICSS
    • Los Alamitos
    • Peerenboom, J.P., Fisher, R.E.: Analyzing Cross-Sector Interdependencies. In: IEEE Computer Society, HICSS 2007, pp. 112-119. IEEE Computer Society, Los Alamitos (2007)
    • (2007) 112-119. IEEE Computer Society , pp. 2007
    • Peerenboom, J.P.1    Fisher, R.E.2
  • 5
    • 70350604954 scopus 로고    scopus 로고
    • Byres, E., Lowe, J.: The myths and facts behind cyber security risks for industrial control systems. In: 'VDE Congress, VDE Association For Electrical, Electronic Information Technologies, British Columbia Institute of Technology and PA Consulting Group (2004)
    • Byres, E., Lowe, J.: The myths and facts behind cyber security risks for industrial control systems. In: 'VDE Congress, VDE Association For Electrical, Electronic Information Technologies, British Columbia Institute of Technology and PA Consulting Group (2004)
  • 8
    • 33845959570 scopus 로고    scopus 로고
    • International Electrotechnical
    • IEC 60870-5-104, Commission
    • IEC 60870-5-104, International Electrotechnical Commission (2006)
    • (2006)
  • 9
    • 70350595708 scopus 로고    scopus 로고
    • IEC 60870-6, ICCP/TASE2, International Electrotechnical Commission (2008)
    • IEC 60870-6, ICCP/TASE2, International Electrotechnical Commission (2008)
  • 10
    • 70350578191 scopus 로고    scopus 로고
    • ISACA, Control Objectives for Information and related Technology, rev. 4.1 (2007)
    • ISACA, Control Objectives for Information and related Technology, rev. 4.1 (2007)
  • 11
    • 0003692134 scopus 로고    scopus 로고
    • Code of Practice for Information Security Management
    • ISO/IEC 17799
    • ISO/IEC 17799:2005, Code of Practice for Information Security Management (2005)
    • (2005)
  • 12
    • 70350588471 scopus 로고    scopus 로고
    • NIST Special Publication 800-53 revision 2, Recommended Security Controls for Federal Information Systems (2007)
    • NIST Special Publication 800-53 revision 2, Recommended Security Controls for Federal Information Systems (2007)
  • 13
    • 70350604955 scopus 로고    scopus 로고
    • NIST Special Publication 800-82, DRAFT - Guide to Industrial Control Systems (ICS) Security (2007)
    • NIST Special Publication 800-82, DRAFT - Guide to Industrial Control Systems (ICS) Security (2007)
  • 14
    • 70350591363 scopus 로고    scopus 로고
    • BCIT, British Columbia Institute of Technology
    • BCIT, British Columbia Institute of Technology (2008), http://www.bcit.ca/
    • (2008)
  • 15
    • 70350590544 scopus 로고    scopus 로고
    • CERT, Carnegie Mellon Software Engineering Institute, CERT/CC Statistics (1988-2008), http://www.cert.org/stats/vulnerability-remediation.html
    • CERT, Carnegie Mellon Software Engineering Institute, CERT/CC Statistics (1988-2008), http://www.cert.org/stats/vulnerability-remediation.html


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.