Validation and generalization of a method for precise size measurements of metal nanoclusters on supports

Ultramicroscopy

Volumn 110, Issue 1, 2009, Pages 48-60

  Reed, B W ^a   Morgan, D G ^b,c   Okamoto, N L ^b,d   Kulkarni, A ^b   Gates, B C ^b   Browning, N D ^a,b  

^a LAWRENCE LIVERMORE NATIONAL LABORATORY   (United States)

^b University of California Davis   (United States)

^c INDIANA UNIVERSITY   (United States)

^d KYOTO UNIVERSITY   (Japan)

Author keywords

Data processing image processing; Microscopic methods, specifically for catalysts and small particles; Scanning transmission electron microscopy (STEM)

Indexed keywords

DATA ANALYSIS METHODS; DATA PROCESSING/IMAGE PROCESSING; HEAVY METAL ATOMS; LOW SIGNAL-TO-NOISE RATIO; METAL NANOCLUSTERS; MICROSCOPIC METHODS, SPECIFICALLY FOR CATALYSTS AND SMALL PARTICLES; ORIENTATION DISTRIBUTIONS; PROBE SIZE; SCANNING TRANSMISSION ELECTRON MICROSCOPES; SCANNING TRANSMISSION ELECTRON MICROSCOPY (STEM); SIZE MEASUREMENTS; SMALL CLUSTERS;

CATALYSIS; CATALYSTS; DATA PROCESSING; ELECTRIC FIELD MEASUREMENT; ELECTRON MICROSCOPES; ERROR CORRECTION; HEAVY METALS; METAL RECOVERY; RANDOM ERRORS; SCANNING; SCANNING ELECTRON MICROSCOPY; SIGNAL TO NOISE RATIO; SYSTEMATIC ERRORS; TRANSMISSION ELECTRON MICROSCOPY;

METAL ANALYSIS;

HEAVY METAL; METAL NANOPARTICLE;

ACCURACY; ANALYTIC METHOD; ANALYTICAL ERROR; ANISOTROPY; ARTICLE; ATOM; MEASUREMENT; NANOPROBE; RADIOSENSITIVITY; RELIABILITY; SIGNAL NOISE RATIO; SIMULATION; VALIDATION STUDY;

EID: 70350591060     PISSN: 03043991     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.ultramic.2009.09.005     Document Type: Article

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