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Volumn 31, Issue 2, 2007, Pages 820-823

On the statistics of ELM filaments measured by fast low field side wall Langmuir probes on TCV

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EID: 70350583365     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper
Times cited : (2)

References (3)


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.