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Volumn 31, Issue 2, 2007, Pages 820-823
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On the statistics of ELM filaments measured by fast low field side wall Langmuir probes on TCV
a b c d b
a
EPFL
(Switzerland)
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Author keywords
[No Author keywords available]
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Indexed keywords
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EID: 70350583365
PISSN: None
EISSN: None
Source Type: Conference Proceeding
DOI: None Document Type: Conference Paper |
Times cited : (2)
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References (3)
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