Optical calibration for both out-of-plane and in-plane displacement sensitivity of acoustic emission sensors

Ultrasonics

Volumn 49, Issue 8, 2009, Pages 623-627

  Theobald, P D ^a  

^a NATIONAL PHYSICAL LABORATORY   (United Kingdom)

Author keywords

Acoustic emission; AE sensor; Calibration; Interferometer

Indexed keywords

ACOUSTIC EMISSION SENSORS; AE SENSOR; AE SENSORS; DIFFERENT PLANES; DIRECT SHEAR; HIGH SENSITIVITY; IN-PLANE; IN-PLANE DISPLACEMENT; IN-PLANE DISPLACEMENT MEASUREMENT; INTERFEROMETER MEASUREMENT; LASER HOMODYNE; LONGITUDINAL WAVES; NORMAL INCIDENCE; OPTICAL CALIBRATION; OPTICAL METHODS; OUT-OF-PLANE; OUT-OF-PLANE DISPLACEMENT; PER UNIT; PIEZOELECTRIC SENSORS; PISTON SOURCES; SAFETY-CRITICAL; SENSITIVE DETECTION; SENSITIVITY CALIBRATION; SENSOR CALIBRATION; SENSOR OUTPUT; SENSOR SENSITIVITY; STRESS WAVE; SUBSTITUTION METHOD; TIME GATING; WAVE FORMS;

ACOUSTIC EMISSION TESTING; ACOUSTIC EMISSIONS; ACOUSTIC FIELDS; CALIBRATION; ELASTIC WAVES; INTERFEROMETERS; INTERFEROMETRY; LASER BEAMS; LASERS; PIEZOELECTRIC TRANSDUCERS; SURFACE STRUCTURE;

SENSORS;

ACOUSTICS; ARTICLE; CALIBRATION; COMPUTER AIDED DESIGN; ECHOGRAPHY; EQUIPMENT; EQUIPMENT DESIGN; EVALUATION; INSTRUMENTATION; MICROELECTROMECHANICAL SYSTEM; OPTICAL INSTRUMENTATION; REPRODUCIBILITY; SENSITIVITY AND SPECIFICITY; TRANSDUCER; VIBRATION;

ACOUSTICS; CALIBRATION; COMPUTER-AIDED DESIGN; EQUIPMENT DESIGN; EQUIPMENT FAILURE ANALYSIS; MICRO-ELECTRICAL-MECHANICAL SYSTEMS; OPTICAL DEVICES; REPRODUCIBILITY OF RESULTS; SENSITIVITY AND SPECIFICITY; TRANSDUCERS; ULTRASONOGRAPHY; VIBRATION;

EID: 70350576654     PISSN: 0041624X     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.ultras.2009.03.004     Document Type: Article

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