Formation and its mechanism of copper metal layers at surface by annealing in reduced atmosphere in CuO-Li2O-Nb2O5-SiO2 glass

Solid State Ionics

Volumn 180, Issue 28-31, 2009, Pages 1457-1462

  Honma, Tsuyoshi ^a   Oku, Daisuke ^a   Komatsu, Takayuki ^a  

^a NAGAOKA UNIVERSITY OF TECHNOLOGY   (Japan)

Author keywords

Copper; Electrical conductivity in glass; Glass; Hydrogen diffusion; Lithium niobate

Indexed keywords

COPPER IONS; COPPER METAL; ELECTRICAL CONDUCTIVITY IN GLASS; FOURIER TRANSFORM INFRARED; GLASS SURFACES; GLASS TRANSITION TEMPERATURE; HYDROGEN DIFFUSION; KEYPOINTS; LITHIUM NIOBATE; OPTICAL ABSORPTION; REDUCED ATMOSPHERE; SI-H BONDS; SPECTRUM MEASUREMENT; TRACE AMOUNTS;

ABSORPTION SPECTROSCOPY; COPPER; COPPER OXIDES; DIFFUSION; ELECTRIC CONDUCTIVITY; GLASS; HYDROGEN; HYDROGEN BONDS; INFRARED SPECTROSCOPY; LITHIUM; METAL IONS; METALS; NIOBIUM; NIOBIUM COMPOUNDS; SILICON COMPOUNDS;

GLASS TRANSITION;

EID: 70350572369     PISSN: 01672738     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.ssi.2009.09.002     Document Type: Article

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