Vision based metal spectral analysis using multi-label classification

Proceedings of the 2009 Canadian Conference on Computer and Robot Vision, CRV 2009

Volumn , Issue , 2009, Pages 132-139

  Ukwatta, Eranga ^a   Samarabandu, Jagath ^a  

^a UNIVERSITY OF WESTERN ONTARIO   (Canada)

Author keywords

Multi label classification; Pattern recognition; Spectroscopy; SVM

Indexed keywords

ARTIFICIAL NEURAL NETWORK; AUTOMATIC METHOD; DISJOINTNESS; ELEMENTAL ANALYSIS; ELEMENTAL COMPOSITIONS; HIGH RESOLUTION; IN-SITU; INDUSTRIAL EQUIPMENT; LASER-INDUCED BREAKDOWN SPECTROSCOPY; MACHINE LEARNING TECHNIQUES; MACHINE-LEARNING; METAL DETECTION; MULTI-LABEL; MULTI-LABEL CLASSIFICATION; MULTIPLE ELEMENTS; MULTIPLE METALS; POST PROCESSING; QUALITATIVE ANALYSIS; SIMULATION DATA; SPECTRAL ANALYSIS; SVM; TEMPLATE MATCHING TECHNIQUE; VISION BASED;

BACKPROPAGATION; COMPUTATIONAL METHODS; COMPUTER VISION; EMISSION SPECTROSCOPY; LABELS; LASER SPECTROSCOPY; LEARNING ALGORITHMS; METAL ANALYSIS; METAL DETECTORS; METALS; NEURAL NETWORKS; QUALITY CONTROL; ROBOT LEARNING; SPECTROSCOPIC ANALYSIS; SPECTRUM ANALYZERS; SUPPORT VECTOR MACHINES; TEMPLATE MATCHING; VIDEO CAMERAS;

SPECTRUM ANALYSIS;

EID: 70350555405     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/CRV.2009.42     Document Type: Conference Paper

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