Computed tomography image edge degradation model and its application to image size measurement

Guangxue Jingmi Gongcheng/Optics and Precision Engineering

Volumn 17, Issue 9, 2009, Pages 2269-2275

  Chen, Ping ^a   Pan, Jin Xiao ^a   Liu, Bin ^a  

^a NORTH UNIVERSITY OF CHINA   (China)

Author keywords

Degradation model; Edge restoration; Industrial computed tomography; Inflexion; Size measurement

Indexed keywords

DEGRADATION MODEL; EDGE RESTORATION; INDUSTRIAL COMPUTED TOMOGRAPHY; INFLEXION; SIZE MEASUREMENT;

COMPUTERIZED TOMOGRAPHY; DEGRADATION; MEASUREMENTS; RESTORATION;

IMAGE PROCESSING;

EID: 70350554108     PISSN: 1004924X     EISSN: None     Source Type: Journal    
DOI: None     Document Type: Article

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