WISE: Automated test generation forworst-case complexity

Proceedings - International Conference on Software Engineering

Volumn , Issue , 2009, Pages 463-473

  Burnim, Jacob ^a   Juvekar, Sudeep ^a   Sen, Koushik ^a  

^a UNIVERSITY OF CALIFORNIA   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

AUTOMATED TEST GENERATIONS; EXHAUSTIVE TESTS; INPUT SIZE; PROGRAM ANALYSIS; SMALL INPUTS; SYMBOLIC EXECUTION; TESTING ALGORITHM;

AUTOMATION; COMPUTATIONAL COMPLEXITY; COMPUTATIONAL EFFICIENCY; DATA STRUCTURES; SOFTWARE ENGINEERING; SOFTWARE TESTING;

PROGRAM DEBUGGING;

EID: 70350552240     PISSN: 02705257     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/ICSE.2009.5070545     Document Type: Conference Paper

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