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Volumn 45, Issue 22, 2009, Pages 1112-1113
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ISFET threshold voltage programming in CMOS using hot-electron injection
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Author keywords
[No Author keywords available]
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Indexed keywords
BUFFER SOLUTIONS;
CMOS PROCESSS;
PH BUFFERS;
SUPPLY VOLTAGES;
THRESHOLD VOLTAGE SHIFTS;
THRESHOLD VOLTAGE VARIATION;
TRAPPED CHARGE;
BANDPASS FILTERS;
ELECTRON INJECTION;
FIELD EFFECT TRANSISTORS;
ION SENSITIVE FIELD EFFECT TRANSISTORS;
THRESHOLD VOLTAGE;
PH EFFECTS;
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EID: 70350518637
PISSN: 00135194
EISSN: None
Source Type: Journal
DOI: 10.1049/el.2009.2310 Document Type: Article |
Times cited : (14)
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References (7)
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